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Journal Articles(공과대학 > 전기공학과 > Journal Articles)145

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Collection's Items (Sorted by Submit Date in Descending order): 121 to 140 of 145

SCIESCOPUS
The Impact of a Single Displacement Defect on Tunneling Field-Effect Transistors

Kim, Jungsik; Han, Jin-Woo; Meyyappan, M.

ArticleIssue Date2020CitationIEEE Transactions on Electron Devices, v.67, no.11, pp 4765 - 4769PublisherInstitute of Electrical and Electronics Engineers
SCOPUS
Machine Learning Approach for Characteristics Prediction of 4H-Silicon Carbide NMOSFET by Process Conditions

Ha, Jonghyeon; Lee, Gyeongyeop; Kim, Jungsik

ArticleIssue Date2021Citation2021 IEEE REGION 10 SYMPOSIUM (TENSYMP)PublisherIEEE
SCOPUS
Radiation Displacement Defect in Super Junction Insulated Gate Bipolar Transistor (SJ-IGBT)

Lee, Gyeongyeop; Ha, Jonghyeon; Kim, Jungsik

ArticleIssue Date2021Citation2021 IEEE REGION 10 SYMPOSIUM (TENSYMP)PublisherIEEE
SCIESCOPUS
Extraction of Nitride Trap Profile in 3-D NAND Flash Memory Using Intercell Program Patternopen access

Park, Jounghun; Yoon, Gilsang; Go, Donghyun; Kim, Jungsik; Lee, Jeong-Soo

ArticleIssue Date2021CitationIEEE ACCESS, v.9, pp 118794 - 118800PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCOPUS
Single Event Hard Error due to Terrestrial Radiation (invited)

Han, Jin-Woo; Meyyappan, M.; Kim, Jungsik

ArticleIssue Date2021Citation2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), v.2021-MarchPublisherIEEE
SCOPUSKCI
The study on machine learning approach for optimization of superjunction MOSFET

Lee, G.; Ha, J.; Kim, J.

ArticleIssue Date2021CitationTransactions of the Korean Institute of Electrical Engineers, v.70, no.10, pp 1475 - 1480PublisherKorean Institute of Electrical Engineers
SCOPUSKCI
재난으로부터의 계통 복구력 개념과 COVID-19 재난에서 7개국의 확진자수 복구력 특성 분석

박주창; 오웅진; 이연찬; 정세민; 최재석

ArticleIssue Date2021Citation전기학회논문지, v.70, no.2, pp 259 - 268Publisher대한전기학회
KCI
머신러닝을 이용한 나노시트 전계효과 트랜지스터의 구조변화에 대한 영향도 분석

박건호; 김정식

ArticleIssue Date2021Citation전자공학회논문지, v.58, no.8, pp 43 - 48Publisher대한전자공학회
KCI
전산모사 시뮬레이션을 이용한 방사선 Displacement Defect에 의한 Superjunction MOSFET의 열화 현상

이경엽; 김정식

ArticleIssue Date2021Citation전자공학회논문지, v.58, no.8, pp 49 - 55Publisher대한전자공학회
KCI
Anti-Notch 구조를 적용한 Spoke Type IPMSM의 출력 및 리플 개선 연구

정민경; 강동우; 김태형

ArticleIssue Date2021Citation전기학회 논문지 P권, v.70, no.4, pp 240 - 244Publisher대한전기학회
KCI
헤어핀 권선이 적용된 IPMSM의 구동 속도별 고정자 슬롯 형상 파라미터 변화에 따른 AC동손 민감도 분석

정상근; 김태형; 강동우

ArticleIssue Date2021Citation전기학회 논문지 P권, v.70, no.4, pp 245 - 249Publisher대한전기학회
SCIESCOPUSKCI
The Impact of Displacement Defect in Nanosheet Field Effect Transistor

Kim, Jungsik

ArticleIssue Date2021CitationJOURNAL OF ELECTRICAL ENGINEERING & TECHNOLOGY, v.16, no.1, pp 525 - 529PublisherSPRINGER SINGAPORE PTE LTD
SCIESCOPUS
Surround Gate Transistor With Epitaxially Grown Si Pillar and Simulation Study on Soft Error and Rowhammer Tolerance for DRAM

Han, Jin-Woo; Kim, Jungsik; Beery, Dafna; Bozdag, K. Deniz; Cuevas, Peter; Levi, Amitay; Tain, Irwin; Tran, Khai; Walker, Andrew J.; Palayam, Senthil Vadakupudhu, et al.

ArticleIssue Date2021CitationIEEE Transactions on Electron Devices, v.68, no.2, pp 529 - 534PublisherInstitute of Electrical and Electronics Engineers
SCIESCOPUS
Insights into radiation displacement defect in an insulated-gate bipolar transistoropen access

Kim, Kihyun; Kim, Jungsik

ArticleIssue Date2021CitationAIP ADVANCES, v.11, no.2PublisherAMER INST PHYSICS
SCIESCOPUS
Novel Program Scheme of Vertical NAND Flash Memory for Reduction of Z-Interferenceopen access

Yi, Su-in; Kim, Jungsik

ArticleIssue Date2021CitationMICROMACHINES, v.12, no.5PublisherMDPI
SCIESCOPUS
Total ionizing dose effects on nanosheet and nanowire field effect transistors

Han, Jin-Woo; Kim, Jungsik; Meyyappan, M.

ArticleIssue Date2021CitationMicroelectronics and Reliability, v.121PublisherElsevier Ltd.
SCIESCOPUS
Machine Learning Approach for Prediction of Point Defect Effect in FinFET

Kim, Jungsik; Kim, Sun Jin; Han, Jin-Woo; Meyyappan, M.

ArticleIssue Date2021CitationIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, v.21, no.2, pp 252 - 257PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUSKCI
A Study on Reliability and Capacity Credit Evaluation of China Power System Considering WTG with Multi Energy Storage Systems

Zhao, Jingfeng; Oh, Ungjin; Lee, Yeonchan; Park, Joochang; Choi, Jaeseok

ArticleIssue Date2021CitationJOURNAL OF ELECTRICAL ENGINEERING & TECHNOLOGY, v.16, no.5, pp 2367 - 2378PublisherSPRINGER SINGAPORE PTE LTD
SCIESCOPUS
Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling Oxide of 3D NAND Flash Memoryopen access

Yoon, Gilsang; Ko, Donghyun; Park, Jounghun; Kim, Donghwi; Kim, Jungsik; Lee, Jeong-Soo

ArticleIssue Date2022CitationIEEE Access, v.10, pp 62423 - 62428PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
Effects of Carbon Incorporation on Electrical Characteristics and Thermal Stability of Ti/TiO2/n-Ge MIS Contactopen access

Park, Iksoo; Shin, Seonghwan; Kim, Jungsik; Jin, Bo; Lee, Jeong-Soo

ArticleIssue Date2022CitationIEEE Access, v.10, pp 84689 - 84693PublisherInstitute of Electrical and Electronics Engineers Inc.
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