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The study on machine learning approach for optimization of superjunction MOSFET

Authors
Lee, G.Ha, J.Kim, J.
Issue Date
Oct-2021
Publisher
Korean Institute of Electrical Engineers
Keywords
Machine Learning; Numerical simulation; Superjunction MOSFET; TCAD simulation
Citation
Transactions of the Korean Institute of Electrical Engineers, v.70, no.10, pp 1475 - 1480
Pages
6
Indexed
SCOPUS
KCI
Journal Title
Transactions of the Korean Institute of Electrical Engineers
Volume
70
Number
10
Start Page
1475
End Page
1480
URI
https://scholarworks.gnu.ac.kr/handle/sw.gnu/5655
DOI
10.5370/KIEE.2021.70.10.1475
ISSN
1975-8359
2287-4364
Abstract
In this work, the the adoption of machine learning for optimization of superjunction MOSFET is investigated. Abundant data (on-resistance(RON), breakdown voltage(BV)) with various process parameters is earned by technology computer-aided design (TCAD) simulation. We also compare the prediction accuracy between eXtreme Gradient Boosting (XGBoost) and Light Gradient Boosting Machine (LightGBM). XGBoost shows higher accuracy than LightGBM. The use of machine learning is very effective way to reduce the cost and time of superjunction MOSFET development. Copyright ? The Korean Institute of Electrical Engineers.
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