상세 보기
자료 필터
자료유형
발행연도
2020 ~ 2027
2020 2027
키워드
언어
선택된 필터
- article
- conference
- book
전체 52건 중 11번부터 20번까지의 결과를 표시합니다.
2025
Article
Soft Error in Saddle Fin-Based DRAM at Cryogenic Temperature
- Ryu, Minsang ;
- Suh, Minki ;
- Ha, Jonghyeon ;
- Bang, Minji ;
- Lee, Dabok ;
- ... Kim, Jungsik ;
- 외 3명
- 2025-07
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Investigation of TID and DD Effects on FD SOI Nanowire FET Induced by Proton Irradiation
- Lee, Dabok ;
- Ha, Jonghyeon ;
- Suh, Minki ;
- Ryu, Minsang ;
- Casse, Mikael ;
- ... Jeon, Dae-Young ;
- ... Kim, Jungsik ;
- 외 1명
- 2025-06
- IEEE Transactions on Electron Devices
- Institute of Electrical and Electronics Engineers
2024
Article
Comprehensive Hammering and Parasitic BJT Effects in Vertically Stacked DRAM
- Suh, Minki ;
- Ryu, Minsang ;
- Ha, Jonghyeon ;
- Bang, Minji ;
- Lee, Dabok ;
- ... Kim, Jungsik ;
- 외 2명
- 2024-10
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Decomposition of Charge Loss Mechanisms in 3-D Nand Flash Memory: Impact of Cell Dimension via High-Temperature Long-Term Retention Characteristics
- Park, Jounghun ;
- Yoon, Gilsang ;
- Go, Donghyun ;
- Kim, Donghwi ;
- Sagong, Hyun Chul ;
- ... Kim, Jungsik ;
- 외 1명
- 2024-10
- IEEE Transactions on Electron Devices
- Institute of Electrical and Electronics Engineers
Article
Impact of Electron and Hole Trap Profiles in BE-TOX on Retention Characteristics of 3D NAND Flash Memory
- Yoon, Gilsang ;
- Go, Donghyun ;
- Park, Jounghun ;
- Kim, Donghwi ;
- Kim, Jongwoo ;
- ... Kim, Jungsik ;
- 외 3명
- 2024-10
- IEEE Transactions on Nanotechnology
- Institute of Electrical and Electronics Engineers Inc.
Article
Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell
- Bang, Minji ;
- Ha, Jonghyeon ;
- Suh, Minki ;
- Lee, Dabok ;
- Ryu, Minsang ;
- ... Kim, Jungsik ;
- 외 3명
- 2024-09
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Novel Dummy Cell Programming Scheme to Improve Retention Characteristics in 3-D NAND Flash Memory
- Kim, Donghwi ;
- Yoon, Gilsang ;
- Go, Donghyun ;
- Park, Jounghun ;
- Kim, Jungsik ;
- 외 1명
- 2024-08
- IEEE Transactions on Electron Devices
- Institute of Electrical and Electronics Engineers
Article
Low-frequency noise characterization of positive bias stress effect on the spatial distribution of trap in β-Ga2O3 FinFET
- Bae, Hagyoul ;
- Lee, Geon Bum ;
- Yoo, Jaewook ;
- Lee, Khwang-Sun ;
- Ku, Ja-Yun ;
- ... Kim, Jungsik ;
- 외 4명
- 2024-05
- Solid-State Electronics
- Pergamon Press Ltd.
Article
Design Guideline of Saddle-Fin-Based DRAM for Mitigating Rowhammer Effect
- Suh, Minki ;
- Ryu, Minsang ;
- Ha, Jonghyeon ;
- Bang, Minji ;
- Lee, Dabok ;
- ... Kim, Jungsik
- 2024-04
- IEEE Transactions on Electron Devices
- Institute of Electrical and Electronics Engineers
Article
Effect of Quasi-One-Dimensional Properties on Source/Drain Contacts in Vertical Nanowire Field-Effect Transistors (VNWFETs)
- Park, Iksoo ;
- Choi, Jaeyong ;
- Kim, Jungsik ;
- Kong, Byoung Don ;
- Lee, Jeong-Soo
- 2024-04
- Micromachines
- Multidisciplinary Digital Publishing Institute (MDPI)