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자료 필터
자료유형
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2020 ~ 2026
2020 2026
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선택된 필터
- article
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전체 51건 중 1번부터 10번까지의 결과를 표시합니다.
2026
Article
Total-Ionizing Dose Effect in 3-D Charge-Trap nand Flash Memory Cells
- Park, Jounghun ;
- Kim, Jungsik ;
- Shastry, Vishwanath ;
- Lee, Jeong-Soo ;
- Yi, Su-in
- 2026-06
- IEEE Transactions on Electron Devices
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Low-Power Voltage Regulator with Adaptive Feedback Speed Control for High Voltage Energy Harvesting System
- Seok, Wonil ;
- Kim, Jungsik ;
- Choi, Woong ;
- Shim, Minseob
- 2026-04
- Journal of Electrical Engineering & Technology
- 대한전기학회
Article
Indium Tin Oxide Vertical Channel Transistors for Scaled 4F2 2T0C Gain Cell Memory with Etched Sidewall Cleaning
- Gu, Hyeonho ;
- Jung, Haksoon ;
- Park, Minho ;
- Lee, Hyeonjin ;
- Choi, Ae Rim ;
- ... Kim, Jungsik ;
- 외 6명
- 2026-04
- IEEE Electron Device Letters
- Institute of Electrical and Electronics Engineers Inc.
Article
Design of Highly Stackable Charge Trap-Based 3D DRAM
- Kim, Hyeongyu ;
- Lee, Dabok ;
- Choi, Hyun-Sik ;
- Seol, Yoojin ;
- Ha, Jonghyeon ;
- ... Kim, Jungsik ;
- 외 4명
- 2026-02
- IEEE Region 10 Annual International Conference, Proceedings/TENCON
- Institute of Electrical and Electronics Engineers Inc.
Article
Hole Trap Extraction in Charge Trap Layer of 3-D nand Flash Memory
- Go, Donghyun ;
- Park, Jounghun ;
- Kim, Donghwi ;
- Ju, Jinuk ;
- Kim, Seungjae ;
- ... Kim, Jungsik ;
- 외 1명
- 2026-02
- IEEE Transactions on Electron Devices
- Institute of Electrical and Electronics Engineers
Article
Radiation effect in FD-SOI nanowire FETs due to high dose rate gamma-ray under variable irradiation temperatures
- Ha, Jonghyeon ;
- Suh, Minki ;
- Ryu, Minsang ;
- Lee, Dabok ;
- Jeon, Dae-Young ;
- ... Kim, Jungsik
- 2026-01
- Microelectronics and Reliability
- Elsevier Ltd.
2025
Article
Analysis of Charge Loss Decomposition and Nonlinear Ea in 3-D NAND Flash Memory Using a Neutral Cell-Based Method
- Park, Jounghun ;
- Go, Donghyun ;
- Kim, Donghwi ;
- Kim, Jungsik ;
- Lee, Jeong-Soo
- 2025-12
- IEEE Electron Device Letters
- Institute of Electrical and Electronics Engineers
Article
Abnormal Operation of 6-T SRAM based on Nanosheet FET due to Total Ionizing Dose
- Ha, Jonghyeon ;
- Bang, Minji ;
- Suh, Minki ;
- Lee, Dabok ;
- Ryu, Minsang ;
- ... Kim, Jungsik ;
- 외 3명
- 2025-09
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Single-Event Upset and Total Ionizing Dose Effects on DDR4 DRAM Due to Proton Irradiation Under Different Temperatures
- Ryu, Minsang ;
- Suh, Minki ;
- Ha, Jonghyeon ;
- Lee, Dabok ;
- Lee, Hojoon ;
- ... Kim, Jungsik ;
- 외 1명
- 2025-09
- IEEE Transactions on Electron Devices
- Institute of Electrical and Electronics Engineers
Article
Soft Error in Saddle Fin-Based DRAM at Cryogenic Temperature
- Ryu, Minsang ;
- Suh, Minki ;
- Ha, Jonghyeon ;
- Bang, Minji ;
- Lee, Dabok ;
- ... Kim, Jungsik ;
- 외 3명
- 2025-07
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
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