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자료 필터
자료유형
발행연도
2020 ~ 2027
2020 2027
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선택된 필터
- article
- conference
- book
전체 52건 중 21번부터 30번까지의 결과를 표시합니다.
2024
Article
심층신경망을 이용한 3D Vertical SONOS NAND Flash의 Grain Boundary Distribution과 Geometrical Variation에 의한 전기적 특성 변동 분석
- 하종현 ;
- 방민지 ;
- 이다복 ;
- 서민기 ;
- 류민상 ;
- ... 김정식
- 2024-04
- 전자공학회논문지
- 대한전자공학회
2023
Article
Effect of Noncircular Channel on Distribution of Threshold Voltage in 3D NAND Flash Memory
- Go, Donghyun ;
- Yoon, Gilsang ;
- Park, Jounghun ;
- Kim, Donghwi ;
- Kim, Jiwon ;
- ... Kim, Jungsik ;
- 외 1명
- 2023-11
- Micromachines
- Multidisciplinary Digital Publishing Institute (MDPI)
Article
심층신경망을 이용한 Total Ionizing Dose 및 Displacement Defect에 의한 Saddle Fin DRAM의 열화 특성 예측
- 류민상 ;
- 하종현 ;
- 이경엽 ;
- 서민기 ;
- 방민지 ;
- ... 김정식 ;
- 외 1명
- 2023-11
- 전자공학회논문지
- 대한전자공학회
Article
Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Models
- Ha, Jonghyeon ;
- Kim, Sun Jin ;
- Bang, Minji ;
- Lee, Gyeongyeop ;
- Suh, Minki ;
- ... Kim, Jungsik ;
- 외 2명
- 2023-10
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects
- Lee, Gyeongyeop ;
- Suh, Minki ;
- Ryu, Minsang ;
- Lee, Yunjong ;
- Han, Jin-Woo ;
- ... Kim, Jungsik
- 2023-09
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memory
- Ha, Jonghyeon ;
- Bang, Minji ;
- Lee, Gyeongyeop ;
- Suh, Minki ;
- Kim, Chong-Eun ;
- ... Kim, Jungsik
- 2023-09
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Overhang Saddle Fin Sidewall Structure for Highly Reliable DRAM Operation
- Han, Jin-Woo ;
- Suh, Minki ;
- Lee, Gyeongyeop ;
- Kim, Jungsik
- 2023-08
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defects
- Bang, Minji ;
- Ha, Jonghyeon ;
- Lee, Gyeongyeop ;
- Suh, Minki ;
- Kim, Jungsik
- 2023-05
- Micromachines
- Multidisciplinary Digital Publishing Institute (MDPI)
Article
Decomposition of Vertical and Lateral Charge Loss in Long-term Retention of 3-D NAND Flash Memory
- Park, J. ;
- Yoon, G. ;
- Go, D. ;
- Kim, D. ;
- An, U. ;
- ... Kim, Jungsik ;
- 외 2명
- 2023-03
- IEEE International Reliability Physics Symposium Proceedings
- Institute of Electrical and Electronics Engineers Inc.
2022