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자료 필터
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2020 ~ 2027
2020 2027
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선택된 필터
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전체 52건 중 31번부터 40번까지의 결과를 표시합니다.
2022
Article
Single-Event Upset in 3-D Charge-Trap NAND Flash Memories
- Park, Jounghun ;
- Han, Jin-Woo ;
- Yoon, Gilsang ;
- Go, Donghyun ;
- Kim, Donghwi ;
- ... Kim, Jungsik ;
- 외 1명
- 2022-11
- IEEE Transactions on Electron Devices
- Institute of Electrical and Electronics Engineers
Article
Effects of Carbon Incorporation on Electrical Characteristics and Thermal Stability of Ti/TiO2/n-Ge MIS Contact
- Park, Iksoo ;
- Shin, Seonghwan ;
- Kim, Jungsik ;
- Jin, Bo ;
- Lee, Jeong-Soo
- 2022-08
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FET
- Ha, Jonghyeon ;
- Lee, Gyeongyeop ;
- Bae, Hagyoul ;
- Kim, Kihyun ;
- Han, Jin-Woo ;
- ... Kim, Jungsik
- 2022-08
- Micromachines
- Multidisciplinary Digital Publishing Institute (MDPI)
Article
Impact of P/E Stress on Trap Profiles in Bandgap-Engineered Tunneling Oxide of 3D NAND Flash Memory
- Yoon, Gilsang ;
- Ko, Donghyun ;
- Park, Jounghun ;
- Kim, Donghwi ;
- Kim, Jungsik ;
- 외 1명
- 2022-06
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.
Article
Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors
- Lee, Gyeongyeop ;
- Ha, Jonghyeon ;
- Kim, Kihyun ;
- Bae, Hagyoul ;
- Kim, Chong-Eun ;
- ... Kim, Jungsik
- 2022-06
- Micromachines
- Multidisciplinary Digital Publishing Institute (MDPI)
Article
Improvement of Fermi-Level Pinning and Contact Resistivity in Ti/Ge Contact Using Carbon Implantation
- Park, Iksoo ;
- Lee, Donghun ;
- Jin, Bo ;
- Kim, Jungsik ;
- Lee, Jeong-Soo
- 2022-01
- Micromachines
- Multidisciplinary Digital Publishing Institute (MDPI)
2021
Article
머신러닝 이용한 슈퍼접합 모스펫의 최적화 연구
- Lee, G. ;
- Ha, J. ;
- Kim, J.
- 2021-10
- 전기학회논문지
- Korean Institute of Electrical Engineers
Article
Machine Learning Approach for Characteristics Prediction of 4H-Silicon Carbide NMOSFET by Process Conditions
- Ha, Jonghyeon ;
- Lee, Gyeongyeop ;
- Kim, Jungsik
- 2021-08
- 2021 IEEE REGION 10 SYMPOSIUM (TENSYMP)
- IEEE
Article
Extraction of Nitride Trap Profile in 3-D NAND Flash Memory Using Intercell Program Pattern
- Park, Jounghun ;
- Yoon, Gilsang ;
- Go, Donghyun ;
- Kim, Jungsik ;
- Lee, Jeong-Soo
- 2021-08
- IEEE Access
- Institute of Electrical and Electronics Engineers Inc.