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Crop Protection

ISSN

P 0261-2194 E 1873-6904

출판사

Butterworth Scientific Ltd.

국가

ENGLAND

발행 상태

활성

데이터베이스 수록 정보

CiteScore 2011-2025 (15년)

JCR 1997-2025 (29년)

SCI 2010-2019 (10년)

SCIE 2010-2026 (17년)

Scopus 1982-2026 (45년)

SJR 1999-2020, 2022-2025 (26년)

전체 15건 중 1번부터 10번까지의 결과를 표시합니다.

2026

Article

Total-Ionizing Dose Effect in 3-D Charge-Trap nand Flash Memory Cells

Park, Jounghun ;
Kim, Jungsik ;
Shastry, Vishwanath ;
Lee, Jeong-Soo ;
Yi, Su-in

2026-06
IEEE Transactions on Electron Devices
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Article

Hole Trap Extraction in Charge Trap Layer of 3-D nand Flash Memory

Go, Donghyun ;
Park, Jounghun ;
Kim, Donghwi ;
Ju, Jinuk ;
Kim, Seungjae ;
... Kim, Jungsik ;
외 1명

2026-02
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers

2025

Article

In-Depth Electrical Characterization of Carrier Transport in Tellurium/Silicon Heterojunction-Based p-n Diode

Kim, Yohan ;
Lim, Gyuri ;
Park, Byeongjin ;
Yoon, Jongwon ;
Kim, Yonghun ;
... Jeon, Dae-Young

2025-12
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers

Article

Single-Event Upset and Total Ionizing Dose Effects on DDR4 DRAM Due to Proton Irradiation Under Different Temperatures

Ryu, Minsang ;
Suh, Minki ;
Ha, Jonghyeon ;
Lee, Dabok ;
Lee, Hojoon ;
... Kim, Jungsik ;
외 1명

2025-09
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers

Article

Back-Gate Bias-Controllable Subthreshold Slope of Junctionless Transistors

Jeon, Dae-Young ;
Park, So Jeong ;
Barraud, Sylvain ;
Ghibaudo, Gerard

2025-07
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers

Article

Investigation of TID and DD Effects on FD SOI Nanowire FET Induced by Proton Irradiation

Lee, Dabok ;
Ha, Jonghyeon ;
Suh, Minki ;
Ryu, Minsang ;
Casse, Mikael ;
... Jeon, Dae-Young ;
... Kim, Jungsik ;
외 1명

2025-06
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers

2024

Article

Decomposition of Charge Loss Mechanisms in 3-D Nand Flash Memory: Impact of Cell Dimension via High-Temperature Long-Term Retention Characteristics

Park, Jounghun ;
Yoon, Gilsang ;
Go, Donghyun ;
Kim, Donghwi ;
Sagong, Hyun Chul ;
... Kim, Jungsik ;
외 1명

2024-10
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers

Article

Novel Dummy Cell Programming Scheme to Improve Retention Characteristics in 3-D NAND Flash Memory

Kim, Donghwi ;
Yoon, Gilsang ;
Go, Donghyun ;
Park, Jounghun ;
Kim, Jungsik ;
외 1명

2024-08
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers

Article

Design Guideline of Saddle-Fin-Based DRAM for Mitigating Rowhammer Effect

Suh, Minki ;
Ryu, Minsang ;
Ha, Jonghyeon ;
Bang, Minji ;
Lee, Dabok ;
... Kim, Jungsik

2024-04
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers

2023

Article

Y2O3-Based Crossbar Array for Analog and Neuromorphic Computation

Kumar, Sanjay ;
Kumbhar, Dhananjay D. D. ;
Park, Jun H. H. ;
Kamat, Rajanish K. K. ;
Dongale, Tukaram D. D. ;
외 1명

2023-02
IEEE Transactions on Electron Devices
Institute of Electrical and Electronics Engineers