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SCIESCOPUS
Comprehensive Hammering and Parasitic BJT Effects in Vertically Stacked DRAMopen access

Suh, Minki; Ryu, Minsang; Ha, Jonghyeon; Bang, Minji; Lee, Dabok; Lee, Hojoon; Sagong, Hyunchul; Kim, Jungsik

ArticleIssue Date2024CitationIEEE Access, v.12, pp 155119 - 155124PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
Design Guideline of Saddle-Fin-Based DRAM for Mitigating Rowhammer Effect

Suh, Minki; Ryu, Minsang; Ha, Jonghyeon; Bang, Minji; Lee, Dabok; Kim, Jungsik

ArticleIssue Date2024CitationIEEE Transactions on Electron Devices, v.71, no.4, pp 1 - 6PublisherInstitute of Electrical and Electronics Engineers
SCIESCOPUS
Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistorsopen access

Lee, Gyeongyeop; Ha, Jonghyeon; Kim, Kihyun; Bae, Hagyoul; Kim, Chong-Eun; Kim, Jungsik

ArticleIssue Date2022CitationMICROMACHINES, v.13, no.6PublisherMDPI
SCOPUS
Machine Learning Approach for Characteristics Prediction of 4H-Silicon Carbide NMOSFET by Process Conditions

Ha, Jonghyeon; Lee, Gyeongyeop; Kim, Jungsik

ArticleIssue Date2021Citation2021 IEEE REGION 10 SYMPOSIUM (TENSYMP)PublisherIEEE
SCIESCOPUS
Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cellopen access

Bang, Minji; Ha, Jonghyeon; Suh, Minki; Lee, Dabok; Ryu, Minsang; Han, Jin-Woo; Sagong, Hyunchul; Lee, Hojoon; Kim, Jungsik

ArticleIssue Date2024CitationIEEE Access, v.12, pp 130347 - 130355PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FETopen access

Ha, Jonghyeon; Lee, Gyeongyeop; Bae, Hagyoul; Kim, Kihyun; Han, Jin-Woo; Kim, Jungsik

ArticleIssue Date2022CitationMICROMACHINES, v.13, no.8PublisherMDPI
SCOPUS
Radiation Displacement Defect in Super Junction Insulated Gate Bipolar Transistor (SJ-IGBT)

Lee, Gyeongyeop; Ha, Jonghyeon; Kim, Jungsik

ArticleIssue Date2021Citation2021 IEEE REGION 10 SYMPOSIUM (TENSYMP)PublisherIEEE
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