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Direct observation of charge trap density and its spatial distribution in a four-bit/cell SONOS memory using a charge pumping method

Authors
김병철
Issue Date
11-Feb-2009
URI
https://scholarworks.gnu.ac.kr/handle/sw.gnu/67194
Conference Name
제36회 한국진공학회 동계 정기학술대회 초록집
Location
대한민국
현대성우리조트
Conference Date
2009-02-11 ~ 2009-02-13
metadata.conference.dc.citation.conferenceName
제36회 한국진공학회 동계 정기학술대회
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융합기술공과대학 > Division of Converged Electronic Engineering > Conference Papers

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IT공과대학 (전자공학부)
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