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Direct observation of charge trap density and its spatial distribution in a four-bit/cell SONOS memory using a charge pumping method
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김병철 | - |
| dc.date.accessioned | 2023-08-05T06:45:45Z | - |
| dc.date.available | 2023-08-05T06:45:45Z | - |
| dc.date.issued | 2009-02-11 | - |
| dc.identifier.uri | https://scholarworks.gnu.ac.kr/handle/sw.gnu/67194 | - |
| dc.title | Direct observation of charge trap density and its spatial distribution in a four-bit/cell SONOS memory using a charge pumping method | - |
| dc.type | Conference | - |
| dc.citation.title | 제36회 한국진공학회 동계 정기학술대회 초록집 | - |
| dc.citation.startPage | 185 | - |
| dc.citation.endPage | 185 | - |
| dc.citation.conferenceName | 제36회 한국진공학회 동계 정기학술대회 | - |
| dc.citation.conferencePlace | 대한민국 | - |
| dc.citation.conferencePlace | 현대성우리조트 | - |
| dc.citation.conferenceDate | 2009-02-11 ~ 2009-02-13 | - |
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Collections - 융합기술공과대학 > Division of Converged Electronic Engineering > Conference Papers
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