Reliability analysis in poly-Si thin film nonvolatile memory after program/erase cycling

김병철

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Reliability analysis in poly-Si thin film nonvolatile memory after program/erase cycling

Authors: 김병철

Issue Date: 20-Dec-2012

Publisher: University of Western Australia

Citation: ISFM 2012

URI: https://scholarworks.gnu.ac.kr/handle/sw.gnu/63432

Conference Name: ISFM 2012

Place: AT

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Appears in Collections: 융합기술공과대학 > Division of Converged Electronic Engineering > Conference Papers

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