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Reliability analysis in poly-Si thin film nonvolatile memory after program/erase cycling
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김병철 | - |
| dc.date.accessioned | 2023-08-04T18:42:18Z | - |
| dc.date.available | 2023-08-04T18:42:18Z | - |
| dc.date.issued | 2012-12-20 | - |
| dc.identifier.uri | https://scholarworks.gnu.ac.kr/handle/sw.gnu/63432 | - |
| dc.title | Reliability analysis in poly-Si thin film nonvolatile memory after program/erase cycling | - |
| dc.type | Conference | - |
| dc.citation.title | ISFM 2012 | - |
| dc.citation.conferenceName | ISFM 2012 | - |
| dc.citation.conferencePlace | 호주 | - |
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