ScholarWorks@Gyeongsang National University

Browsing by Lee, GyeongyeopAuthor

All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

Showing results 1 to 9 of 9

SCIESCOPUS
Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memoryopen access

Ha, Jonghyeon; Bang, Minji; Lee, Gyeongyeop; Suh, Minki; Kim, Chong-Eun; Kim, Jungsik

ArticleIssue Date2023CitationIEEE Access, v.11, pp 97682 - 97688PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistorsopen access

Lee, Gyeongyeop; Ha, Jonghyeon; Kim, Kihyun; Bae, Hagyoul; Kim, Chong-Eun; Kim, Jungsik

ArticleIssue Date2022CitationMicromachines, v.13, no.6PublisherMultidisciplinary Digital Publishing Institute (MDPI)
SCIESCOPUS
Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effectsopen access

Lee, Gyeongyeop; Suh, Minki; Ryu, Minsang; Lee, Yunjong; Han, Jin-Woo; Kim, Jungsik

ArticleIssue Date2023CitationIEEE Access, v.11, pp 97456 - 97465PublisherInstitute of Electrical and Electronics Engineers Inc.
SCOPUS
Machine Learning Approach for Characteristics Prediction of 4H-Silicon Carbide NMOSFET by Process Conditions

Ha, Jonghyeon; Lee, Gyeongyeop; Kim, Jungsik

ArticleIssue Date2021Citation2021 IEEE REGION 10 SYMPOSIUM (TENSYMP)PublisherIEEE
SCIESCOPUS
On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FETopen access

Ha, Jonghyeon; Lee, Gyeongyeop; Bae, Hagyoul; Kim, Kihyun; Han, Jin-Woo; Kim, Jungsik

ArticleIssue Date2022CitationMicromachines, v.13, no.8PublisherMultidisciplinary Digital Publishing Institute (MDPI)
SCIESCOPUS
Overhang Saddle Fin Sidewall Structure for Highly Reliable DRAM Operationopen access

Han, Jin-Woo; Suh, Minki; Lee, Gyeongyeop; Kim, Jungsik

ArticleIssue Date2023CitationIEEE Access, v.11, pp 1 - 1PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defectsopen access

Bang, Minji; Ha, Jonghyeon; Lee, Gyeongyeop; Suh, Minki; Kim, Jungsik

ArticleIssue Date2023CitationMicromachines, v.14, no.5PublisherMultidisciplinary Digital Publishing Institute (MDPI)
SCIESCOPUS
Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Modelsopen access

Ha, Jonghyeon; Kim, Sun Jin; Bang, Minji; Lee, Gyeongyeop; Suh, Minki; Shim, Minseob; Kim, Chong-Eun; Kim, Jungsik

ArticleIssue Date2023CitationIEEE Access, v.11, pp 125217 - 125225PublisherInstitute of Electrical and Electronics Engineers Inc.
SCOPUS
Radiation Displacement Defect in Super Junction Insulated Gate Bipolar Transistor (SJ-IGBT)

Lee, Gyeongyeop; Ha, Jonghyeon; Kim, Jungsik

ArticleIssue Date2021Citation2021 IEEE REGION 10 SYMPOSIUM (TENSYMP)PublisherIEEE
1

RSS_1.0 RSS_2.0 ATOM_1.0

Gyeongsang National University Central Library, 501, Jinju-daero, Jinju-si, Gyeongsangnam-do, 52828, Republic of Korea+82-55-772-0532

COPYRIGHT 2022 GYEONGSANG NATIONAL UNIVERSITY LIBRARY. ALL RIGHTS RESERVED.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

BROWSE

한국어