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Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistorsopen access

Lee, Gyeongyeop; Ha, Jonghyeon; Kim, Kihyun; Bae, Hagyoul; Kim, Chong-Eun; Kim, Jungsik

ArticleIssue Date2022CitationMICROMACHINES, v.13, no.6PublisherMDPI
SCOPUS
Machine Learning Approach for Characteristics Prediction of 4H-Silicon Carbide NMOSFET by Process Conditions

Ha, Jonghyeon; Lee, Gyeongyeop; Kim, Jungsik

ArticleIssue Date2021Citation2021 IEEE REGION 10 SYMPOSIUM (TENSYMP)PublisherIEEE
SCIESCOPUS
On-State Current Degradation Owing to Displacement Defect by Terrestrial Cosmic Rays in Nanosheet FETopen access

Ha, Jonghyeon; Lee, Gyeongyeop; Bae, Hagyoul; Kim, Kihyun; Han, Jin-Woo; Kim, Jungsik

ArticleIssue Date2022CitationMICROMACHINES, v.13, no.8PublisherMDPI
SCOPUS
Radiation Displacement Defect in Super Junction Insulated Gate Bipolar Transistor (SJ-IGBT)

Lee, Gyeongyeop; Ha, Jonghyeon; Kim, Jungsik

ArticleIssue Date2021Citation2021 IEEE REGION 10 SYMPOSIUM (TENSYMP)PublisherIEEE
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