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Cited 3 time in webofscience Cited 2 time in scopus
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Novel Learning Framework with Generative AI X-Ray Images for Deep Neural Network-Based X-Ray Security Inspection of Prohibited Items Detection with You Only Look Once

Authors
Kim, DongsikKang, Jinho
Issue Date
Mar-2025
Publisher
MDPI AG
Keywords
X-ray security inspection; prohibited items; machine learning; deep neural network; object detection; generative AI; copy-paste augmentation; novel framework; image generation; YOLO
Citation
Electronics (Basel), v.14, no.7
Indexed
SCIE
SCOPUS
Journal Title
Electronics (Basel)
Volume
14
Number
7
URI
https://scholarworks.gnu.ac.kr/handle/sw.gnu/78172
DOI
10.3390/electronics14071351
ISSN
2079-9292
2079-9292
Abstract
As the rapid expansion of future mobility systems increases, along with the demand for fast and accurate X-ray security inspections, deep neural network (DNN)-based systems have gained significant attention for detecting prohibited items by constructing high-quality datasets and enhancing detection performance. While Generative AI has been widely explored across various fields, its application in DNN-based X-ray security inspection remains largely underexplored. The accessibility of commercial Generative AI raises safety concerns about the creation of new prohibited items, highlighting the need to integrate synthetic X-ray images into DNN training to improve detection performance, adapt to emerging threats, and investigate its impact on object detection. To address this, we propose a novel machine learning framework that enhances DNN-based X-ray security inspection by integrating real-world X-ray images with Generative AI images utilizing a commercial text-to-image model, improving dataset diversity and detection accuracy. Our proposed framework provides an effective solution to mitigate potential security threats posed by Generative AI, significantly improving the reliability of DNN-based X-ray security inspection systems, as verified through comprehensive evaluations.
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Kang, Jin Ho
IT공과대학 (전자공학부)
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