Novel Learning Framework with Generative AI X-Ray Images for Deep Neural Network-Based X-Ray Security Inspection of Prohibited Items Detection with You Only Look Once
- Authors
- Kim, Dongsik; Kang, Jinho
- Issue Date
- Mar-2025
- Publisher
- MDPI AG
- Keywords
- X-ray security inspection; prohibited items; machine learning; deep neural network; object detection; generative AI; copy-paste augmentation; novel framework; image generation; YOLO
- Citation
- Electronics (Basel), v.14, no.7
- Indexed
- SCIE
SCOPUS
- Journal Title
- Electronics (Basel)
- Volume
- 14
- Number
- 7
- URI
- https://scholarworks.gnu.ac.kr/handle/sw.gnu/78172
- DOI
- 10.3390/electronics14071351
- ISSN
- 2079-9292
2079-9292
- Abstract
- As the rapid expansion of future mobility systems increases, along with the demand for fast and accurate X-ray security inspections, deep neural network (DNN)-based systems have gained significant attention for detecting prohibited items by constructing high-quality datasets and enhancing detection performance. While Generative AI has been widely explored across various fields, its application in DNN-based X-ray security inspection remains largely underexplored. The accessibility of commercial Generative AI raises safety concerns about the creation of new prohibited items, highlighting the need to integrate synthetic X-ray images into DNN training to improve detection performance, adapt to emerging threats, and investigate its impact on object detection. To address this, we propose a novel machine learning framework that enhances DNN-based X-ray security inspection by integrating real-world X-ray images with Generative AI images utilizing a commercial text-to-image model, improving dataset diversity and detection accuracy. Our proposed framework provides an effective solution to mitigate potential security threats posed by Generative AI, significantly improving the reliability of DNN-based X-ray security inspection systems, as verified through comprehensive evaluations.
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