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Cited 3 time in webofscience Cited 2 time in scopus
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Novel Learning Framework with Generative AI X-Ray Images for Deep Neural Network-Based X-Ray Security Inspection of Prohibited Items Detection with You Only Look Once

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dc.contributor.authorKim, Dongsik-
dc.contributor.authorKang, Jinho-
dc.date.accessioned2025-05-08T06:00:13Z-
dc.date.available2025-05-08T06:00:13Z-
dc.date.issued2025-03-
dc.identifier.issn2079-9292-
dc.identifier.issn2079-9292-
dc.identifier.urihttps://scholarworks.gnu.ac.kr/handle/sw.gnu/78172-
dc.description.abstractAs the rapid expansion of future mobility systems increases, along with the demand for fast and accurate X-ray security inspections, deep neural network (DNN)-based systems have gained significant attention for detecting prohibited items by constructing high-quality datasets and enhancing detection performance. While Generative AI has been widely explored across various fields, its application in DNN-based X-ray security inspection remains largely underexplored. The accessibility of commercial Generative AI raises safety concerns about the creation of new prohibited items, highlighting the need to integrate synthetic X-ray images into DNN training to improve detection performance, adapt to emerging threats, and investigate its impact on object detection. To address this, we propose a novel machine learning framework that enhances DNN-based X-ray security inspection by integrating real-world X-ray images with Generative AI images utilizing a commercial text-to-image model, improving dataset diversity and detection accuracy. Our proposed framework provides an effective solution to mitigate potential security threats posed by Generative AI, significantly improving the reliability of DNN-based X-ray security inspection systems, as verified through comprehensive evaluations.-
dc.language영어-
dc.language.isoENG-
dc.publisherMDPI AG-
dc.titleNovel Learning Framework with Generative AI X-Ray Images for Deep Neural Network-Based X-Ray Security Inspection of Prohibited Items Detection with You Only Look Once-
dc.typeArticle-
dc.publisher.location스위스-
dc.identifier.doi10.3390/electronics14071351-
dc.identifier.scopusid2-s2.0-105002351838-
dc.identifier.wosid001465726000001-
dc.identifier.bibliographicCitationElectronics (Basel), v.14, no.7-
dc.citation.titleElectronics (Basel)-
dc.citation.volume14-
dc.citation.number7-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryComputer Science, Information Systems-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusBAGGAGE INSPECTION-
dc.subject.keywordPlusCOMPUTER VISION-
dc.subject.keywordPlusSYNTHETIC DATA-
dc.subject.keywordPlusYOLOV8-
dc.subject.keywordAuthorX-ray security inspection-
dc.subject.keywordAuthorprohibited items-
dc.subject.keywordAuthormachine learning-
dc.subject.keywordAuthordeep neural network-
dc.subject.keywordAuthorobject detection-
dc.subject.keywordAuthorgenerative AI-
dc.subject.keywordAuthorcopy-paste augmentation-
dc.subject.keywordAuthornovel framework-
dc.subject.keywordAuthorimage generation-
dc.subject.keywordAuthorYOLO-
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