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질화막 두께에 따른 전하트랩 플래시(CTF) 메모리 소자의 신뢰성 분석
- Authors
- 김병철
- Issue Date
- 28-Jun-2012
- Publisher
- 한국전기전자재료학회
- Citation
- 한국전기전자재료학회 하계학술대회
- Conference Name
- 한국전기전자재료학회 하계학술대회
- Place
- KO
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Collections - 융합기술공과대학 > Division of Converged Electronic Engineering > Conference Papers
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