Detailed Information

Cited 98 time in webofscience Cited 118 time in scopus
Metadata Downloads

Quantification of surface roughness of parts processed by laminated object manufacturing

Authors
Ahn, DaekeonKweon, Jin-HweChoi, JinhoLee, Seokhee
Issue Date
Feb-2012
Publisher
Elsevier BV
Keywords
Additive manufacturing; Laminated object manufacturing; Surface roughness
Citation
Journal of Materials Processing Technology, v.212, no.2, pp 339 - 346
Pages
8
Indexed
SCIE
SCOPUS
Journal Title
Journal of Materials Processing Technology
Volume
212
Number
2
Start Page
339
End Page
346
URI
https://scholarworks.gnu.ac.kr/handle/sw.gnu/22352
DOI
10.1016/j.jmatprotec.2011.08.013
ISSN
0924-0136
Abstract
Additive manufacturing (AM) technology is essentially performed using a layered manufacturing (LM) process. Because more complex 3D physical models can be efficiently fabricated without geometric limitation by the technology, a remarkable reduction in production life cycle has been achieved. However, due to the LM process, a deterioration of the surface quality of the parts processed by AM may occasionally occur, which is the primary reason that the surface problem has been a key issue in AM. In this paper, a methodology is proposed to quantify the surface roughness of the parts processed by laminated object manufacturing (LOM), which is a typical technology in AM. The surface profiles of the parts were investigated, a schematic was constructed by considering the LOM process factor geometrically, and a theoretical approach to quantify average surface roughness according to surface angle variation is presented. The expressions required for numerical computation were deduced and defined. By comparing the measured data and computed values, the proposed approach was verified. Additionally, the effects of the process variables related to surface quality were evaluated and analyzed. (C) 2011 Elsevier B.V. All rights reserved.
Files in This Item
There are no files associated with this item.
Appears in
Collections
공학계열 > 기계항공우주공학부 > Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Altmetrics

Total Views & Downloads

BROWSE