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Structural and electrical properties of semiconducting YBa2Cu3O6+x thin film by sol-gel for uncooled infrared detectors

Authors
Lee, Tae-HoLee, Sung-GapJeong, Jae-Woon
Issue Date
Apr-2015
Publisher
KOREAN ASSOC CRYSTAL GROWTH, INC
Keywords
Thin films; Sol-gel growth; Electrical properties; Electron microscopy(SEM)
Citation
JOURNAL OF CERAMIC PROCESSING RESEARCH, v.16, no.2, pp 188 - 192
Pages
5
Indexed
SCI
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF CERAMIC PROCESSING RESEARCH
Volume
16
Number
2
Start Page
188
End Page
192
URI
https://scholarworks.gnu.ac.kr/handle/sw.gnu/17341
ISSN
1229-9162
2672-152X
Abstract
Uncooled pyroelectric infrared detectors based on semiconducting YBa2Cu3O6+x (YBCO) thin films were investigated. YBCO precursor solutions were prepared using the sol-gel method and YBCO films were fabricated by spin coating. The structural and electrical properties at varying annealing temperatures were studied. From differential thermal analysis and thermogravimetry (DTA-TG) results, an endothermic peak was observed at around 700 degrees C, due to the formation of a tetragonal phase. The crystal structure of the YBCO film annealed at 600 degrees C similar to 800 degrees C was a polycrystalline tetragonal phase. All specimens displayed a second phase (BaCO3). The YBCO film sintered at 700 degrees C showed a small grain size and smooth surface. The temperature resistance coefficient (TCR), responsivity and detectivity of the YBCO film sintered at 700 degrees C were -2.76%/degrees C at room temperature, 36.17V/W and 4.77 x 10(6) cmHz1/2W(-1), respectively.
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