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Structural and electrical properties of semiconducting YBa2Cu3O6+x thin film by sol-gel for uncooled infrared detectors

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dc.contributor.authorLee, Tae-Ho-
dc.contributor.authorLee, Sung-Gap-
dc.contributor.authorJeong, Jae-Woon-
dc.date.accessioned2022-12-26T21:48:02Z-
dc.date.available2022-12-26T21:48:02Z-
dc.date.issued2015-04-
dc.identifier.issn1229-9162-
dc.identifier.issn2672-152X-
dc.identifier.urihttps://scholarworks.gnu.ac.kr/handle/sw.gnu/17341-
dc.description.abstractUncooled pyroelectric infrared detectors based on semiconducting YBa2Cu3O6+x (YBCO) thin films were investigated. YBCO precursor solutions were prepared using the sol-gel method and YBCO films were fabricated by spin coating. The structural and electrical properties at varying annealing temperatures were studied. From differential thermal analysis and thermogravimetry (DTA-TG) results, an endothermic peak was observed at around 700 degrees C, due to the formation of a tetragonal phase. The crystal structure of the YBCO film annealed at 600 degrees C similar to 800 degrees C was a polycrystalline tetragonal phase. All specimens displayed a second phase (BaCO3). The YBCO film sintered at 700 degrees C showed a small grain size and smooth surface. The temperature resistance coefficient (TCR), responsivity and detectivity of the YBCO film sintered at 700 degrees C were -2.76%/degrees C at room temperature, 36.17V/W and 4.77 x 10(6) cmHz1/2W(-1), respectively.-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherKOREAN ASSOC CRYSTAL GROWTH, INC-
dc.titleStructural and electrical properties of semiconducting YBa2Cu3O6+x thin film by sol-gel for uncooled infrared detectors-
dc.typeArticle-
dc.publisher.location대한민국-
dc.identifier.scopusid2-s2.0-84940024741-
dc.identifier.wosid000354777600002-
dc.identifier.bibliographicCitationJOURNAL OF CERAMIC PROCESSING RESEARCH, v.16, no.2, pp 188 - 192-
dc.citation.titleJOURNAL OF CERAMIC PROCESSING RESEARCH-
dc.citation.volume16-
dc.citation.number2-
dc.citation.startPage188-
dc.citation.endPage192-
dc.type.docTypeArticle-
dc.identifier.kciidART002328116-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryMaterials Science, Ceramics-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordAuthorThin films-
dc.subject.keywordAuthorSol-gel growth-
dc.subject.keywordAuthorElectrical properties-
dc.subject.keywordAuthorElectron microscopy(SEM)-
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