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The study on fatigue lifetime evaluation on the interconnect of diaphragm type pressure sensor according to various

Huh, S.-C.; Shim, J.-J.; Choi, J.-H.; Kweon, J.-H.

ArticleIssue Date2008CitationJournal of Computational and Theoretical Nanoscience, v.5, no.8, pp 1763 - 1767

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