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Engineering anisotropic magnetoresistance of Hall bars with interfacial organic layers

Park, Jun Hong; Ribeiro, Mario; Pham, Thi Kim Hang; Lee, Nyun Jong; Eom, Tai-woon; Jo, Junhyeon; Park, Seung-Young; Rhim, Sonny H.; Nakamura, Kohji; Yoo, Jung-Woo, et al.

ArticleIssue Date2020CitationJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, v.38, no.4PublisherAmerican Institute of Physics
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