Lee, Dabok; Ha, Jonghyeon; Suh, Minki; Ryu, Minsang; Casse, Mikael; Nicoletti, Sergio; Jeon, Dae-Young; Kim, Jungsik
ArticleIssue Date2025CitationIEEE Transactions on Electron Devices, v.72, no.6, pp 2795 - 2800PublisherInstitute of Electrical and Electronics Engineers