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Hole Trap Extraction in Charge Trap Layer of 3-D nand Flash Memory

Go, Donghyun; Park, Jounghun; Kim, Donghwi; Ju, Jinuk; Kim, Seungjae; Kim, Jungsik; Lee, Jeong-Soo

ArticleIssue Date2026CitationIEEE Transactions on Electron DevicesPublisherInstitute of Electrical and Electronics Engineers Inc.
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