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이진화 메커니즘을 활용한 플라스틱 제품의 (POM) 적외선열화상 자동화 검사에 관한 연구Study on Automated Inspection of Infrared Thermography of Plastic(POM) Products Using a Binarization Mechanism

Other Titles
Study on Automated Inspection of Infrared Thermography of Plastic(POM) Products Using a Binarization Mechanism
Authors
손승우김규섭
Issue Date
Dec-2023
Publisher
한국기계가공학회
Keywords
POM(폴리아세탈); Lock-In(위상잠금); Infrared Thermography(적외선열화상); Otsu’s Algorithm(오츠알고리즘); Binarization(이진화); Automated Detection(자동화 검출)
Citation
한국기계가공학회지, v.22, no.12, pp 59 - 65
Pages
7
Indexed
KCI
Journal Title
한국기계가공학회지
Volume
22
Number
12
Start Page
59
End Page
65
URI
https://scholarworks.gnu.ac.kr/handle/sw.gnu/69206
DOI
10.14775/ksmpe.2023.22.12.059
ISSN
1598-6721
2288-0771
Abstract
In this study, to automatically detect defects shown in infrared thermography, the optimal threshold analyzedby the Otsu algorithm was applied to infrared thermography to obtain binarized images that are easy todistinguish with the naked eye. Automatic detection was performed using Matlab bwboundaries function tool. A study was conducted to improve defect detection by recognizing defects and marking the boundariesaround the defect area. Consequently, an automatic inspection method using a non-destructive inspectiontechnology was presented to apply a method that can inspect all products in the process of producing plastic(POM) products
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Kim, Kyu Seob
공과대학 (미래자동차공학과)
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