이진화 메커니즘을 활용한 플라스틱 제품의 (POM) 적외선열화상 자동화 검사에 관한 연구Study on Automated Inspection of Infrared Thermography of Plastic(POM) Products Using a Binarization Mechanism
- Other Titles
- Study on Automated Inspection of Infrared Thermography of Plastic(POM) Products Using a Binarization Mechanism
- Authors
- 손승우; 김규섭
- Issue Date
- Dec-2023
- Publisher
- 한국기계가공학회
- Keywords
- POM(폴리아세탈); Lock-In(위상잠금); Infrared Thermography(적외선열화상); Otsu’s Algorithm(오츠알고리즘); Binarization(이진화); Automated Detection(자동화 검출)
- Citation
- 한국기계가공학회지, v.22, no.12, pp 59 - 65
- Pages
- 7
- Indexed
- KCI
- Journal Title
- 한국기계가공학회지
- Volume
- 22
- Number
- 12
- Start Page
- 59
- End Page
- 65
- URI
- https://scholarworks.gnu.ac.kr/handle/sw.gnu/69206
- DOI
- 10.14775/ksmpe.2023.22.12.059
- ISSN
- 1598-6721
2288-0771
- Abstract
- In this study, to automatically detect defects shown in infrared thermography, the optimal threshold analyzedby the Otsu algorithm was applied to infrared thermography to obtain binarized images that are easy todistinguish with the naked eye. Automatic detection was performed using Matlab bwboundaries function tool.
A study was conducted to improve defect detection by recognizing defects and marking the boundariesaround the defect area. Consequently, an automatic inspection method using a non-destructive inspectiontechnology was presented to apply a method that can inspect all products in the process of producing plastic(POM) products
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