Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
위상잠금 적외선열화상 기법을 이용한 플라스틱(POM) 이면결함 검출에 관한 연구A Study on the Detection of Defects on the Back Side of Polyacetal Using Lock-In Infrared Thermography
- Other Titles
- A Study on the Detection of Defects on the Back Side of Polyacetal Using Lock-In Infrared Thermography
- Issue Date
- Jul-2023
- Publisher
- 한국기계가공학회
- Keywords
- POM( ); Defects Detection( 폴리아세탈 결함검출); Lock-In( ); Infrared Thermography 위상잠금 (적외선열화상); Signal to Noise Ratio(신호 대 잡음비)
- Citation
- 한국기계가공학회지, v.22, no.7, pp 55 - 61
- Pages
- 7
- Indexed
- KCI
- Journal Title
- 한국기계가공학회지
- Volume
- 22
- Number
- 7
- Start Page
- 55
- End Page
- 61
- ISSN
- 1598-6721
2288-0771
- Abstract
- This study investigated the detection of defects such as pores and cracks generated during the manufacturingprocess of polyacetal (POM), the plastic part material used in automotive parts manufacturing. POM wasfabricated as a backside defect specimen, and defects were detected using lock-in infrared thermography(LIT). The frequency was applied from 0.1 Hz to 0.01 Hz using the heat source of a halogen lamp. Theamplitude and phase images were generated by applying the four-point method algorithm to the LIT datathrough MATLAB, and the optimized excitation frequency of the POM specimen was presented throughsignal-to-noise ratio (SNR) analysis
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 공학계열 > 미래자동차공학과 > Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.