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위상잠금 적외선열화상 기법을 이용한 플라스틱(POM) 이면결함 검출에 관한 연구
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 손승우 | - |
| dc.contributor.author | 김규섭 | - |
| dc.date.accessioned | 2023-09-21T04:43:43Z | - |
| dc.date.available | 2023-09-21T04:43:43Z | - |
| dc.date.issued | 2023-07 | - |
| dc.identifier.issn | 1598-6721 | - |
| dc.identifier.issn | 2288-0771 | - |
| dc.identifier.uri | https://scholarworks.gnu.ac.kr/handle/sw.gnu/67785 | - |
| dc.description.abstract | This study investigated the detection of defects such as pores and cracks generated during the manufacturingprocess of polyacetal (POM), the plastic part material used in automotive parts manufacturing. POM wasfabricated as a backside defect specimen, and defects were detected using lock-in infrared thermography(LIT). The frequency was applied from 0.1 Hz to 0.01 Hz using the heat source of a halogen lamp. Theamplitude and phase images were generated by applying the four-point method algorithm to the LIT datathrough MATLAB, and the optimized excitation frequency of the POM specimen was presented throughsignal-to-noise ratio (SNR) analysis | - |
| dc.format.extent | 7 | - |
| dc.language | 한국어 | - |
| dc.language.iso | KOR | - |
| dc.publisher | 한국기계가공학회 | - |
| dc.title | 위상잠금 적외선열화상 기법을 이용한 플라스틱(POM) 이면결함 검출에 관한 연구 | - |
| dc.title.alternative | A Study on the Detection of Defects on the Back Side of Polyacetal Using Lock-In Infrared Thermography | - |
| dc.type | Article | - |
| dc.publisher.location | 대한민국 | - |
| dc.identifier.doi | 10.14775/ksmpe.2023.22.07.055 | - |
| dc.identifier.bibliographicCitation | 한국기계가공학회지, v.22, no.7, pp 55 - 61 | - |
| dc.citation.title | 한국기계가공학회지 | - |
| dc.citation.volume | 22 | - |
| dc.citation.number | 7 | - |
| dc.citation.startPage | 55 | - |
| dc.citation.endPage | 61 | - |
| dc.identifier.kciid | ART002981969 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | kci | - |
| dc.subject.keywordAuthor | POM( ) | - |
| dc.subject.keywordAuthor | Defects Detection( 폴리아세탈 결함검출) | - |
| dc.subject.keywordAuthor | Lock-In( ) | - |
| dc.subject.keywordAuthor | Infrared Thermography 위상잠금 (적외선열화상) | - |
| dc.subject.keywordAuthor | Signal to Noise Ratio(신호 대 잡음비) | - |
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