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Analysis on the interface traps and their energy didtribution for tunnel oxide degradation in 3D NAND array by using charge pumping technique

Authors
김병철
Issue Date
28-Aug-2012
URI
https://scholarworks.gnu.ac.kr/handle/sw.gnu/63744
Conference Name
IUMRS-ICA 2012
Location
대한민국
metadata.conference.dc.citation.conferenceName
IUMRS-ICA 2012
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융합기술공과대학 > Division of Converged Electronic Engineering > Conference Papers

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IT공과대학 (전자공학부)
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