Single Event Hard Error due to Terrestrial Radiation (invited)

Abstract

Terrestrial radiation is ubiquitous. Alpha particle radioactive contamination is often found in semiconductor packaging materials, and neutrons generated by cosmic rays constantly approach the ground. Historically, these radiations are regarded as a source of soft-error. We are in the era of aggressive device miniaturization, operation voltage scaling and increasing frequency. Herein, we present that the terrestrial radiation-induced single event can potentially result in hard-error. As a result, radiation hard-error hardening might be necessary in the near future even in consumer electronics.