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사이리스터 소자의 수명예측을 위한 열화진단기술
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 김병철 | - |
| dc.contributor.author | 김형우 | - |
| dc.contributor.author | 서길수 | - |
| dc.date.accessioned | 2022-12-27T07:06:16Z | - |
| dc.date.available | 2022-12-27T07:06:16Z | - |
| dc.date.issued | 2007 | - |
| dc.identifier.issn | 1226-7945 | - |
| dc.identifier.issn | 2288-3258 | - |
| dc.identifier.uri | https://scholarworks.gnu.ac.kr/handle/sw.gnu/28552 | - |
| dc.description.abstract | The accelerated aging test equipment which is possible to apply voltage and temperature at the same time, is fabricated to predict lifetime of high capacity thyristor in short time. The variations of the forward/reverse breakdown voltage and the leakage current are investigated as an aging diagnostic tool. Lifetimes of the devices which are predicted from the reverse breakdown voltage with an accelerated aging time, have shown 3-15 years. | - |
| dc.format.extent | 5 | - |
| dc.publisher | 한국전기전자재료학회 | - |
| dc.title | 사이리스터 소자의 수명예측을 위한 열화진단기술 | - |
| dc.title.alternative | The Aging Diagnostic Technology for Predicting Lifetime of Thyristor Devices | - |
| dc.type | Article | - |
| dc.publisher.location | 대한민국 | - |
| dc.identifier.bibliographicCitation | 전기전자재료학회논문지, v.20, no.3, pp 197 - 201 | - |
| dc.citation.title | 전기전자재료학회논문지 | - |
| dc.citation.volume | 20 | - |
| dc.citation.number | 3 | - |
| dc.citation.startPage | 197 | - |
| dc.citation.endPage | 201 | - |
| dc.identifier.kciid | ART001089717 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | kci | - |
| dc.subject.keywordAuthor | Thyristor | - |
| dc.subject.keywordAuthor | Accelerated aging test equipment | - |
| dc.subject.keywordAuthor | Voltage | - |
| dc.subject.keywordAuthor | Temperature | - |
| dc.subject.keywordAuthor | Device lifetime | - |
| dc.subject.keywordAuthor | Thyristor | - |
| dc.subject.keywordAuthor | Accelerated aging test equipment | - |
| dc.subject.keywordAuthor | Voltage | - |
| dc.subject.keywordAuthor | Temperature | - |
| dc.subject.keywordAuthor | Device lifetime | - |
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Collections - 융합기술공과대학 > Division of Converged Electronic Engineering > Journal Articles
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