Synthesis and studies on 2-hexylthieno[3,2-b]thiophene end-capped oligomers for OTFTs
- Authors
- Kim, Hyung-Sun; Kim, Yun-Hi; Kim, Tae-Hoon; Noh, Yong-Young; Pyo, Seungmoon; Yi, Mi Hye; Kim, Dong-You; Kwon, Soon-Ki
- Issue Date
- Jul-2007
- Publisher
- American Chemical Society
- Citation
- Chemistry of Materials, v.19, no.14, pp 3561 - 3567
- Pages
- 7
- Indexed
- SCIE
SCOPUS
- Journal Title
- Chemistry of Materials
- Volume
- 19
- Number
- 14
- Start Page
- 3561
- End Page
- 3567
- URI
- https://scholarworks.gnu.ac.kr/handle/sw.gnu/28329
- DOI
- 10.1021/cm070053g
- ISSN
- 0897-4756
1520-5002
- Abstract
- The new semiconductors that were composed of a naphthalene or anthracene core unit and alkylated thienothiophene on both sides, 2,6-bis(5'-hexyl-thieno[3,2-b]thiophen-2'-yl)naphthalene (DH-TNT) and 2,6-bis(5';-hexyl-thieno[3,2-b]thiophen-2'-yl)anthracene (DH-TAT), were synthesized by Suzuki coupling reaction. The obtained oligomers were characterized by FT-IR, mass and elemental analysis, UV-visible spectroscopy, cyclovoltammetry, differencial scanning calorimetry, and thermogravimetric analysis. Vacuum-evaporated films were characterized by X-ray diffraction and atomic force microscopy (AFM). They all form highly ordered polycrystalline vacuum-evaporated films. DH-TAT exhibits excellent field-effect performances, with a hole mobility of 0.14 cm(2)/Vs, an on/off current ratio of 6.3 x 10(6), and a good threshold voltage of -14 V when it was deposited at T-s = 120 degrees C on HMDS-treated SiO2. DH-TNT shows a hole mobility of 0.084 cm(2)/Vs and an on/off current ratio of 8.8 x 10(5) when it was deposited at T-s = 100 degrees C.
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Collections - 공학계열 > Dept.of Materials Engineering and Convergence Technology > Journal Articles
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