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Quantitative analysis of retained austenite in Nb added Fe-based alloyopen access

Authors
Ko, K.K.Jang, J.H.Tiwari, S.Bae, H.J.Sung, H.K.Kim, J.G.Seol, J.B.
Issue Date
2022
Publisher
Springer
Keywords
LePera etching; Nital etching; Optical microscopy; Retained austenite
Citation
Applied Microscopy, v.52, no.1
Indexed
SCOPUS
KCI
Journal Title
Applied Microscopy
Volume
52
Number
1
URI
https://scholarworks.bwise.kr/gnu/handle/sw.gnu/2719
DOI
10.1186/s42649-022-00074-1
ISSN
2287-5123
Abstract
The use of Pipelines for long-distance transportation of crude oil, natural gas and similar applications is increasing and has pivotal importance in recent times. High specific strength plays a crucial role in improving transport efficiency through increased pressure and improved laying efficiency through reduced diameter and weight of line pipes. TRIP-based high-strength and high-ductility alloys comprise a mixture of ferrite, bainite, and retained austenite that provide excellent mechanical properties such as dimensional stability, fatigue strength, and impact toughness. This study performs microstructure analysis using both Nital etching and LePera etching methods. At the time of Nital etching, it is difficult to distinctly observe second phase. However, using LePera etching conditions it is possible to distinctly measure the M/A phase and ferrite matrix. The fraction measurement was done using OM and SEM images which give similar results for the average volume fraction of the phases. Although it is possible to distinguish the M/A phase from the SEM image of the sample subjected to LePera etching. However, using Nital etching is nearly impossible. Nital etching is good at specific phase analysis than LePera etching when using SEM images. ? 2022, The Author(s).
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