Detailed Information

Cited 15 time in webofscience Cited 16 time in scopus
Metadata Downloads

Factors influencing fatigue crack propagation behavior of austenitic steels

Authors
Kim, SangshikKwon, JaekiKim, YoungjuJang, WookilLee, SoongiChoi, Jongkyo
Issue Date
Jul-2013
Publisher
KOREAN INST METALS MATERIALS
Keywords
alloys; deformation; microstructure; fatigue; scanning electron microscopy
Citation
METALS AND MATERIALS INTERNATIONAL, v.19, no.4, pp.683 - 690
Indexed
SCIE
SCOPUS
KCI
Journal Title
METALS AND MATERIALS INTERNATIONAL
Volume
19
Number
4
Start Page
683
End Page
690
URI
https://scholarworks.bwise.kr/gnu/handle/sw.gnu/20603
DOI
10.1007/s12540-013-4007-5
ISSN
1598-9623
Abstract
In the present study, the fatigue crack propagation (FCP) behaviors of austenitic single phase steels, including STS304, Fe18Mn and Fe22Mn with different grain sizes ranging from 12 mu m to 98 mu m were investigated. The FCP tests were conducted in air at an R ratio of 0.1 using compact tension specimens and the crack paths and fracture surfaces were documented by using an SEM. The highest Delta K-th value of 9.9MPa center dot m(1/2) was observed for the Fe18Mn specimen, followed by 5.2MPa center dot m(1/2) for the Fe22Mn specimen and 4.6MPa center dot m(1/2) for the STS304 specimen, showing a substantial difference in the near-threshold FCP resistance for each microstructure. The crack path and fractographic analyses suggested that the near-threshold FCP behavior of these austenitic steels was largely influenced by the degree of slip planarity, as determined by stacking fault energy and grain size, rather than the tensile properties. In the Paris' regime, the slip planarity still played an important role while the tensile properties began to affect the FCP. The FCP behavior of austenitic steels with different microstructural features are discussed based on detailed fractographic and micrographic observations.
Files in This Item
There are no files associated with this item.
Appears in
Collections
공학계열 > Dept.of Materials Engineering and Convergence Technology > Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Sang Shik photo

Kim, Sang Shik
대학원 (나노신소재융합공학과)
Read more

Altmetrics

Total Views & Downloads

BROWSE