Directionally Aligned Amorphous Polymer Chains via Electrohydrodynamic-Jet Printing: Analysis of Morphology and Polymer Field-Effect Transistor Characteristics
- Authors
- Kim, Yebyeol; Bae, Jaehyun; Song, Hyun Woo; An, Tae Kyu; Kim, Se Hyun; Kim, Yun-Hi; Park, Chan Eon
- Issue Date
- Nov-2017
- Publisher
- American Chemical Society
- Keywords
- organic field-effect transistor (OFET); electrohydrodynamic-jet printing (EHD-jet printing); surface treatment; near-edge X-ray absorption fine structure (NEXAFS); directional chain alignment
- Citation
- ACS Applied Materials & Interfaces, v.9, no.45, pp 39493 - 39501
- Pages
- 9
- Indexed
- SCI
SCIE
SCOPUS
- Journal Title
- ACS Applied Materials & Interfaces
- Volume
- 9
- Number
- 45
- Start Page
- 39493
- End Page
- 39501
- URI
- https://scholarworks.gnu.ac.kr/handle/sw.gnu/13345
- DOI
- 10.1021/acsami.7b04316
- ISSN
- 1944-8244
1944-8252
- Abstract
- Electrohydrodynamic-jet (EHD-jet) printing provides an opportunity to directly assembled amorphous polymer chains in the printed pattern. Herein, an EHD-jet printed amorphous polymer was employed as the active layer for fabrication of organic field-effect transistors (OFETs). Under optimized conditions, the field-effect mobility (mu(FET)) of the EHD-jet printed OFETs was 5 times higher than the highest mu(FET) observed in the spin-coated OFETs, and this improvement was achieved without the use of complex surface templating or additional pre- or post-deposition processing. As the chain alignment can be affected by the surface energy of the dielectric layer in EHD-jet printed OFETs, dielectric layers with varying wettability were examined. Near-edge X-ray absorption fine structure measurements were performed to compare the amorphous chain alignment in OFET active layers prepared by EHD-jet printing and spin coating.
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