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Decomposition of Charge Loss Mechanisms in 3-D Nand Flash Memory: Impact of Cell Dimension via High-Temperature Long-Term Retention Characteristics

Park, Jounghun; Yoon, Gilsang; Go, Donghyun; Kim, Donghwi; Sagong, Hyun Chul; Kim, Jungsik; Lee, Jeong-Soo

ArticleIssue Date2024CitationIEEE Transactions on Electron Devices, v.71, no.10, pp 6040 - 6048PublisherInstitute of Electrical and Electronics Engineers
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