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Low-frequency noise characterization of positive bias stress effect on the spatial distribution of trap in β-Ga2O3 FinFET

Bae, Hagyoul; Lee, Geon Bum; Yoo, Jaewook; Lee, Khwang-Sun; Ku, Ja-Yun; Kim, Kihyun; Kim, Jungsik; Ye, Peide D.; Park, Jun-Young; Choi, Yang-Kyu

ArticleIssue Date2024CitationSolid-State Electronics, v.215PublisherPergamon Press Ltd.
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