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Effect of Quasi-One-Dimensional Properties on Source/Drain Contacts in Vertical Nanowire Field-Effect Transistors (VNWFETs)open access

Park, Iksoo; Choi, Jaeyong; Kim, Jungsik; Kong, Byoung Don; Lee, Jeong-Soo

ArticleIssue Date2024CitationMicromachines, v.15, no.4PublisherMultidisciplinary Digital Publishing Institute (MDPI)
SCIESCOPUS
Impact of Electron and Hole Trap Profiles in BE-TOX on Retention Characteristics of 3D NAND Flash Memory

Yoon, Gilsang; Go, Donghyun; Park, Jounghun; Kim, Donghwi; Kim, Jongwoo; An, Ukju; Kim, Jungsik; Lee, Jeong-Soo; Kong, Byoung Don

ArticleIssue Date2024CitationIEEE Transactions on Nanotechnology, v.23, pp 733 - 740PublisherInstitute of Electrical and Electronics Engineers Inc.
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