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In-Depth Electrical Characterization of Carrier Transport in Tellurium/Silicon Heterojunction-Based p-n Diode

Kim, Yohan; Lim, Gyuri; Park, Byeongjin; Yoon, Jongwon; Kim, Yonghun; Jeon, Dae-Young

ArticleIssue Date2025CitationIEEE Transactions on Electron DevicesPublisherInstitute of Electrical and Electronics Engineers
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