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Impact of Displacement Defect Owing to Cosmic Rays on Three-Nanometer-Node Nanosheet FET 6T Static Random Access Memoryopen access

Ha, Jonghyeon; Bang, Minji; Lee, Gyeongyeop; Suh, Minki; Kim, Chong-Eun; Kim, Jungsik

ArticleIssue Date2023CitationIEEE Access, v.11, pp 97682 - 97688PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
Prediction of Statistical Distribution on Nanosheet FET by Geometrical Variability Using Various Machine Learning Modelsopen access

Ha, Jonghyeon; Kim, Sun Jin; Bang, Minji; Lee, Gyeongyeop; Suh, Minki; Shim, Minseob; Kim, Chong-Eun; Kim, Jungsik

ArticleIssue Date2023CitationIEEE Access, v.11, pp 125217 - 125225PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUSKCI
Very Accurate Output Voltage Estimation on Primary-side for LLC Resonant Solid-State-Transformer (SST)

Kim, Hwi-Mun; Lee, Young-Dal; Kim, Da-Un; Kim, Chong-Eun

ArticleIssue Date2024CitationJournal of Electrical Engineering & Technology, v.19, no.3, pp 1993 - 1999Publisher대한전기학회
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