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Confidence intervals of the process capability index Cpc$C_{pc}$ revisited via modified bootstrap technique and ROC curves

Ouyang, Linhan; Dey, Sanku; Byun, Jai-Hyun; Park, Chanseok

ArticleIssue Date2023CitationQuality and Reliability Engineering International, v.39, no.6, pp 2162 - 2184PublisherJohn Wiley & Sons Inc.
SCIESCOPUS
Improved bootstrap confidence intervals for the process capability index C-pk

Park, Chanseok; Dey, Sanku; Ouyang, Linhan; Byun, Jai-Hyun; Leeds, Mark

ArticleIssue Date2020CitationCommunications in Statistics Part B: Simulation and Computation, v.49, no.10, pp 2583 - 2603PublisherDekker
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