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Shape memory effect-induced crack closure in Si thin film deposited on a Ti-50.3Ni (at%) alloy substrate

Cho, Gyu-bong; Kim, Bo-min; Choi, Hee-jin; Noh, Jung-pil; Choi, Si-young; Ahn, Hyo-jun; Miyazaki, Shuichi; Nam, Tae-hyun

ArticleIssue Date2010CitationJOURNAL OF ALLOYS AND COMPOUNDS, v.507, no.1, pp L8 - L12PublisherELSEVIER SCIENCE SA
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