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Browsing by Ahn, J. H.Author

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SCISCIESCOPUS
Formation mechanism of inclined fatigue-cracks in ultrafine-grained Cu processed by equal channel angular pressing

Goto, M.; Han, S. Z.; Yamamoto, T.; Kitamura, J.; Ahn, J. H.; Yakushiji, T.; Kim, S. S.; Lee, J.

ArticleIssue Date2016CitationINTERNATIONAL JOURNAL OF FATIGUE, v.92, pp 577 - 587PublisherELSEVIER SCI LTD
SCISCIESCOPUS
S-N plots and related phenomena of ultrafine grained copper with different stages of microstructural evolution

Goto, M.; Han, S. Z.; Kitamura, J.; Yakushiji, T.; Ahn, J. H.; Kim, S. S.; Baba, M.; Yamamoto, T.; Lee, J.

ArticleIssue Date2015CitationINTERNATIONAL JOURNAL OF FATIGUE, v.73, pp 98 - 109PublisherELSEVIER SCI LTD
FOREIGN
S-N property and fatigue damage of ultrafine grained Cu smooth specimensopen access

Goto, M.; Han, S. Z.; Baba, M.; Ahn, J. H.; Kim, S.; Kitamura, J.

ArticleIssue Date2014Citation20TH EUROPEAN CONFERENCE ON FRACTURE, v.3, pp 524 - 530PublisherELSEVIER SCIENCE BV
SCIESCOPUS
Self-discharge characteristics of lithium/sulfur batteries using TEGDME liquid electrolyte

Ryu, H. S.; Ahn, H. J.; Kim, K. W.; Ahn, J. H.; Cho, K. K.; Nam, T. H.

ArticleIssue Date2006CitationELECTROCHIMICA ACTA, v.52, no.4, pp 1563 - 1566PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCIESCOPUS
Simultaneous increase in electrical conductivity and fatigue strength of Cu-Ni-Si alloy by utilizing discontinuous precipitates

Goto, M.; Yamamoto, T.; Han, S. Z.; Utsunomiya, T.; Kim, S.; Kitamura, J.; Ahn, J. H.; Lim, S. H.; Lee, J.

ArticleIssue Date2021CitationMaterials Letters, v.288PublisherElsevier BV
SCIESCOPUS
The risk of parkinson's disease in multiple sclerosis and neuromyelitis optica spectrum disorder: a nationwide cohort study in South Korea

Kwon, S.; Jung, S. Y.; Han, K. -D.; Jung, J. H.; Yeo, Y.; Cho, E. B.; Ahn, J. H.; Shin, D. W.; Min, J. -H.

ArticleIssue Date2022CitationMultiple Sclerosis, v.28, no.3_SUPPL, pp 931 - 932PublisherSAGE Publications
SCISCIESCOPUS
The role of mixed-mode deformation at the crack tip on shear banding and crack propagation of ultrafine-grained copper

Goto, M.; Han, S. Z.; Ahn, J. H.; Yakushiji, T.; Euh, K.; Kim, S. S.; Lee, J.

ArticleIssue Date2014CitationINTERNATIONAL JOURNAL OF FATIGUE, v.66, pp 220 - 228PublisherELSEVIER SCI LTD
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