상세 보기
위상잠금 적외선열화상 기법을 이용한 플라스틱(POM) 이면결함 검출에 관한 연구
A Study on the Detection of Defects on the Back Side of Polyacetal Using Lock-In Infrared Thermography
- 손승우;
- 김규섭
Citations
WEB OF SCIENCE
0Citations
SCOPUS
0초록
This study investigated the detection of defects such as pores and cracks generated during the manufacturingprocess of polyacetal (POM), the plastic part material used in automotive parts manufacturing. POM wasfabricated as a backside defect specimen, and defects were detected using lock-in infrared thermography(LIT). The frequency was applied from 0.1 Hz to 0.01 Hz using the heat source of a halogen lamp. Theamplitude and phase images were generated by applying the four-point method algorithm to the LIT datathrough MATLAB, and the optimized excitation frequency of the POM specimen was presented throughsignal-to-noise ratio (SNR) analysis
키워드
POM( ); Defects Detection( 폴리아세탈 결함검출); Lock-In( ); Infrared Thermography 위상잠금 (적외선열화상); Signal to Noise Ratio(신호 대 잡음비)
- 제목
- 위상잠금 적외선열화상 기법을 이용한 플라스틱(POM) 이면결함 검출에 관한 연구
- 제목 (타언어)
- A Study on the Detection of Defects on the Back Side of Polyacetal Using Lock-In Infrared Thermography
- 저자
- 손승우; 김규섭
- 발행일
- 2023-07
- 저널명
- 한국기계가공학회지
- 권
- 22
- 호
- 7
- 페이지
- 55 ~ 61