Peduncle Detection of Ripe Strawberry to Localize Picking Point using DF-Mask R-CNN and Monocular Depth

  • Tamrakar, Niraj
  • Paudel, Bhola
  • Karki, Sijan
  • Deb, Nibas Chandra
  • Arulmozhi, Elanchezhian
  • ... Kim, Hyeon Tae
  • 외 6명
Citations

WEB OF SCIENCE

5
Citations

SCOPUS

6

초록

Accurate localization of picking points and depth estimation is critical for implementing a robotic strawberry harvesting system. Due to the delicate nature of strawberries, harvesting must be performed without bruising or damage, typically by grasping and cutting the peduncle of the ripe strawberry. However, accurately detecting and localizing the thin peduncle in a cluttered environment is a significant challenge. This study proposed depth fused Mask R-CNN (DF-Mask R-CNN), which integrates depth information of the scene with the RGB image to enhance the detection, localization, and segmentation of strawberries and their peduncles in a greenhouse environment. To generate a dense depth map, a cutting-edge monocular depth estimator, ZoeDepth was used. The proposed DF-Mask R-CNN with ResNet101-FPN exhibited superior instance segmentation performance, with an overall mAP of 81.9%, with mAPsmall at 33.3%, mAPmedium at 78.79%, mAPlarge at 88.8 and APIOU=0.5 at 98.1%. In tests with 300 ripe strawberry samples, the method demonstrated a robust picking point detection, with a mean absolute error and root mean square error of 1.98 cm and 2.12 cm, respectively. These results highlight the effectiveness of the DF-Mask R-CNN model combined with the ZoeDepth estimator in enhancing the detection, localization, and segmentation of strawberries and their peduncles. This approach enables precise picking point localization and depth estimation for efficient vision systems for robotic strawberry harvesting. © 2013 IEEE.

키워드

Instance segmentationMask R-CNNMonocular depth estimationPeduncle detectionPicking Point estimationRipeness Detection
제목
Peduncle Detection of Ripe Strawberry to Localize Picking Point using DF-Mask R-CNN and Monocular Depth
저자
Tamrakar, NirajPaudel, BholaKarki, SijanDeb, Nibas ChandraArulmozhi, ElanchezhianKook, Jung HooKang, Myeong YongKang, Dae YeongOgundele, Oluwasegun MosesNakarmi, BikashByung-Eun, MoonKim, Hyeon Tae
DOI
10.1109/ACCESS.2025.3564288
발행일
2025-04
유형
Article
저널명
IEEE Access
13
페이지
73889 ~ 73902