상세 보기
- 윤철근;
- 박종훈;
- 이상천
초록
This study introduces the process of improving the reliability of electromagnetic compatibility filters by changing the layout of Multilayer Ceramic Capacitors (MLCCs). Cracks are the most common type of MLCC failure mechanism. To overcome this, this study proposes a structure that allows the other side of an MLCC to function properly even if one side is short-circuited. To confirm the improvement, Highly Accelerated Life Test(HALT) of MLCC single structure and layout change structure is conducted. Consequently, it is proved that the layout-changed structure decreases short-circuit failures caused by voltage and heat compared to the existing single structure. The results of this study are expected to significantly improve the reliability of EMC filters using MLCCs.
키워드
- 제목
- Multi-Layer Ceramic Capacitor의 Layout 변경을 통한 Electromagnetic Compatibility 필터 신뢰성 개선 연구
- 제목 (타언어)
- Reliability Improvement of Electromagnetic Compatibility Filter by Changing Layout of Multilayer Ceramic Capacitor
- 저자
- 윤철근; 박종훈; 이상천
- 발행일
- 2023-06
- 저널명
- 국방품질연구논집(JDQS)
- 권
- 5
- 호
- 1
- 페이지
- 11 ~ 19