Channel Length Dependence of Effective Barrier Height Experienced by Charge Carriers in Schottky-Barrier Transistors Based on Si-Nanowire Arrays

  • Jeon, Dae-Young; 
  • Park, So Jeong; 
  • Pregl, Sebastian; 
  • Trommer, Jens; 
  • Heinzig, Andre; 
  • 외 2명
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초록

Schottky-barrier (SB) transistors show great potential as advanced transistors for meeting power, performance, area, and cost requirements. In this study, the dominant transport mechanisms of SB Si-nanowire (NW) transistors were investigated with respect to channel length for accurate performance estimation and to provide key insights for practical applications. Evaluations of the temperature-dependent drain current, transconductance, and activation energy from SB Si-NW transistors revealed that the SB-dominant thermionic effect competes with Si-NW channel-limited conduction when the initial SB height is relatively low. Moreover, the Si-NW channel length was sufficiently long to dominate the total resistance, overcoming resistance effects arising from the SB.

키워드

Transistors; Charge carrier processes; Silicon; Performance evaluation; Logic gates; Thermionic emission; Phonons; Nanowires; Electrons; Tunneling; Channel length dependence; channel-limited conduction; Schottky-barrier dominant thermionic effect; Schottky-barrier transistors; Si-nanowires; BEHAVIOR
제목
Channel Length Dependence of Effective Barrier Height Experienced by Charge Carriers in Schottky-Barrier Transistors Based on Si-Nanowire Arrays
저자
Jeon, Dae-Young; Park, So Jeong; Pregl, Sebastian; Trommer, Jens; Heinzig, Andre; Mikolajick, Thomas; Weber, Walter M.
DOI
10.1109/JEDS.2025.3547860
발행일
2025-03
유형
Article
저널명
IEEE Journal of the Electron Devices Society
권
13
페이지
168 ~ 172