Identifying technological opportunities using the novelty detection technique: a case of laser technology in semiconductor manufacturing

Citations

SCOPUS

41

초록

While identification of technological opportunities has received considerable attention, previous studies have some weaknesses in terms of subjectivity when finding the opportunities in practical terms. This paper proposes a systematic framework to identify technological opportunities, focusing on objective evidences which are specific and practical to be used in a business environment. To do this, we used patents as a source and employed a novelty detection technique whose primary object is detecting the novel pattern. To begin with, the patents are collected from the United States Patent and Trademark Office (USPTO) database. These patents are then pre-processed into a structured keyword vector that can represent the characteristics of each patent. These keyword vectors are then used to analyse the new and emerging pattern, using the novelty detection technique. As the final step, the results are analysed to identify the technological opportunities. A case study on laser technology in lithography is presented to show the proposed framework. ? 2013 Copyright Taylor and Francis Group, LLC.

키워드

data-miningnovelty detectionpatent analysistechnology monitoring
제목
Identifying technological opportunities using the novelty detection technique: a case of laser technology in semiconductor manufacturing
저자
Geum, Y.Jeon, J.Seol, H.
DOI
10.1080/09537325.2012.748892
발행일
2013
유형
Article
저널명
Technology Analysis and Strategic Management
25
1
페이지
1 ~ 22