In-situ 분석을 통한 모드 전이형 멤리스터의 전기 전도 메커니즘 규명

In-situ Investigation of Electrical Conduction Mechanisms in Dual-Mode Memristors

초록

In this study, we propose a dual-mode memristor capable of selectively exhibiting both ferroelectric and resistive switching behaviors within the same MIM structure. The irreversible mode transition enables the device to operate first as a ferroelectric memristor and then as a stable resistive memristor. In-situ I-V fitting confirms that DT-FN tunneling and Poole-Frenkel emission dominate the ferroelectric mode, while SCLC governs the resistive mode. This selective controllability of conduction and memory properties within a single device demonstrates its potential for next-generation memory applicable to PIM-based AI computing architectures requiring both shortand long-term memory functions.

키워드

MemristorProcessing‑in‑MemoryFerroelectricResistive switchingIn-situ analysis
제목
In-situ 분석을 통한 모드 전이형 멤리스터의 전기 전도 메커니즘 규명
제목 (타언어)
In-situ Investigation of Electrical Conduction Mechanisms in Dual-Mode Memristors
저자
이동구이정규
DOI
10.7471/ikeee.2025.29.4.433
발행일
2025-12
유형
Y
저널명
전기전자학회논문지
29
4
페이지
433 ~ 438