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초록
In this study, we propose a dual-mode memristor capable of selectively exhibiting both ferroelectric and resistive switching behaviors within the same MIM structure. The irreversible mode transition enables the device to operate first as a ferroelectric memristor and then as a stable resistive memristor. In-situ I-V fitting confirms that DT-FN tunneling and Poole-Frenkel emission dominate the ferroelectric mode, while SCLC governs the resistive mode. This selective controllability of conduction and memory properties within a single device demonstrates its potential for next-generation memory applicable to PIM-based AI computing architectures requiring both shortand long-term memory functions.
키워드
Memristor; Processing‑in‑Memory; Ferroelectric; Resistive switching; In-situ analysis
- 제목
- In-situ 분석을 통한 모드 전이형 멤리스터의 전기 전도 메커니즘 규명
- 제목 (타언어)
- In-situ Investigation of Electrical Conduction Mechanisms in Dual-Mode Memristors
- 저자
- 이동구; 이정규
- 발행일
- 2025-12
- 유형
- Y
- 저널명
- 전기전자학회논문지
- 권
- 29
- 호
- 4
- 페이지
- 433 ~ 438