Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Interfacial Charge Transport Anisotropy of Organic Field-Effect Transistors Based on Pentacene Derivative Single Crystals with Cofacial Molecular Stack

Full metadata record
DC Field Value Language
dc.contributor.author최현호-
dc.date.accessioned2022-12-26T14:17:00Z-
dc.date.available2022-12-26T14:17:00Z-
dc.date.issued2019-12-
dc.identifier.issn1229-9243-
dc.identifier.urihttps://scholarworks.gnu.ac.kr/handle/sw.gnu/8407-
dc.description.abstractUnderstanding charge transport anisotropy at the interface of conjugated nanostructures basically gives insight into structure-property relationship in organic field-effect transistors (OFET). Here, the anisotropy of the field-effect mobility at the interface between 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS- pentacene) single crystal with cofacial molecular stacks in a-b basal plane and SiO gate dielectric was investigated. A solvent exchange method has been used in order for TIPS-pentacene single crystals to be grown on the surface of SiO2 thin film, corresponding to the charge accumulation at the interface in OFET structure. In TIPS-pentacene OFET, the anisotropy ratio between the highest and lowest measured mobility is revealed to be 5.2. By analyzing the interaction of a conjugated unit in TIPS-pentacene with the nearest neighbor units, the mobility anisotropy can be rationalized by differences in HOMO-level coupling and hopping routes of charge carriers. The theoretical estimation of anisotropy based on HOMO-level coupling is also consistent with the experimental result.-
dc.format.extent7-
dc.language영어-
dc.language.isoENG-
dc.publisher한국접착및계면학회-
dc.titleInterfacial Charge Transport Anisotropy of Organic Field-Effect Transistors Based on Pentacene Derivative Single Crystals with Cofacial Molecular Stack-
dc.title.alternative코페이셜 적층 구조를 가진 펜타센 유도체 단결정기반 유기트랜지스터의 계면 전하이동 이방성에 관한 연구-
dc.typeArticle-
dc.publisher.location대한민국-
dc.identifier.doi10.17702/jai.2019.20.4.155-
dc.identifier.bibliographicCitation접착 및 계면, v.20, no.4, pp 155 - 161-
dc.citation.title접착 및 계면-
dc.citation.volume20-
dc.citation.number4-
dc.citation.startPage155-
dc.citation.endPage161-
dc.identifier.kciidART002550111-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasskci-
dc.description.journalRegisteredClasskciCandi-
Files in This Item
There are no files associated with this item.
Appears in
Collections
공학계열 > Dept.of Materials Engineering and Convergence Technology > Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Choi, Hyun Ho photo

Choi, Hyun Ho
대학원 (나노신소재융합공학과)
Read more

Altmetrics

Total Views & Downloads

BROWSE