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Thermal effects on plasma characteristics in inductively coupled Ar/O2 discharges: a fluid simulation approach

Authors
Kim, Sang-WooCha, Ju-HongLee, Ho-Jun
Issue Date
Oct-2025
Publisher
IOP Publishing Ltd.
Keywords
inductively coupled plasma; neutral gas temperature; oxygen plasma; plasma simulation
Citation
Journal of Physics D: Applied Physics, v.58, no.42
Indexed
SCIE
SCOPUS
Journal Title
Journal of Physics D: Applied Physics
Volume
58
Number
42
URI
https://scholarworks.gnu.ac.kr/handle/sw.gnu/80638
DOI
10.1088/1361-6463/ae0cd7
ISSN
0022-3727
1361-6463
Abstract
This study investigates the impact of neutral gas heating on plasma characteristics in inductively coupled Ar/O2 discharges using a 2D axisymmetric fluid model incorporating thermal flow and heat transfer. Unlike conventional isothermal models, the model incorporates multiple gas heating pathways, such as Franck-Condon heating, ion-neutral charge exchange, and metastable quenching. The analysis was performed across a wide range of operating conditions, including variations in input power, pressure, and O2 mole fraction. Results show that elevated neutral gas temperatures lead to reduced electron, ion, and radical densities due to decreased neutral density and collision frequency, while simultaneously increasing electron temperature through reduced energy loss mechanisms. Additionally, the temperature gradient induces asymmetric radical transport and wall-localized accumulation, particularly for oxygen radicals, driven by the Soret effect and surface recombination dynamics. 300 K and 500 K isothermal models were compared to demonstrate that neglecting thermal effects may result in significant inaccuracies in predicting plasma behavior. The findings emphasize the critical role of incorporating gas heating and thermal transport in plasma modeling to ensure accurate predictions in semiconductor processing applications.
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